DocumentCode
2178280
Title
Reliability growth model in early design stages
Author
Juskowiak, J. ; Schweizer, V. ; Stohrer, M. ; Bertsche, B.
Author_Institution
Inst. of Machine Components, Univ. of Stuttgart, Stuttgart, Germany
fYear
2013
fDate
28-31 Jan. 2013
Firstpage
1
Lastpage
6
Abstract
In this paper, a new model for reliability growth planning in product development as well as a derived potential for its optimization are proposed. Unlike current models which do not have the ability to edit previous input data and thereby update the planning curve, the S-Planning-Curve (SPL), is proposed. Additionally, the SPL test results can be integrated as well. A delay before the beginning of the first test is also taken into account. The use of this integral approach and integration of known models, such as the continuous power law, make the SPL a powerful tool in product development. In addition the computer-based application can be easily used in practice. Because of its flexibility, the SPL model has advantages in different cases compared to the Modified Power Law and the modified IBM-Rosner Model. At the beginning of new complex products, it takes time to analyze the system thoroughly. Consequently this characteristic is implemented by the SPL. Furthermore, a delay time can be used to setup a test station. On the other hand, the SPL allows a response to a discrepancy between the actual and planned reliability at development time.
Keywords
planning; product design; product development; reliability; IBM-Rosner Model; S-planning-curve; SPL; continuous power law; modified power law; product design stage; product development; reliability growth model; reliability growth planning; Educational institutions; Machine components; Mathematical model; Planning; Reliability engineering; Testing; MIBM; MPL; Reliability Growth Analysis; S-Planning-Curve; product design;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
Conference_Location
Orlando, FL
ISSN
0149-144X
Print_ISBN
978-1-4673-4709-9
Type
conf
DOI
10.1109/RAMS.2013.6517687
Filename
6517687
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