• DocumentCode
    2178452
  • Title

    Emerging trends in risk assessment and evaluation

  • Author

    Bowman, Keith ; Huffman, D. ; Akers, J.

  • Author_Institution
    Parametric Technol. Corp., Greensburg, PA, USA
  • fYear
    2013
  • fDate
    28-31 Jan. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Risk assessment is one of the primary tools that management teams use to determine if a product should be taken to market. If the risk associated with the product concept is at an acceptable level, the product proceeds into the design phase. Throughout the product lifecycle, the risk assessment is updated and refined as product functions are built out into the design. Different industries use different tools for risk assessment, but their purpose is the same: to minimize product risk factors. In this paper, we discuss emerging trends in risk assessment for increasing both the value and efficiency of analyses. For example, by taking a systems engineering approach to FMEAs, companies are now rolling failure modes laterally to other subassemblies that can be affected by the same failure rather than merely rolling these modes up product tree structures. Additionally, systems engineers are using the top-down approach common to fault tree analysis and then breaking out only the highest risks into detailed FMEAs to save time. Yet another trend includes linking a FMEA directly to a FRACAS. This allows a direct comparison of what failure modes were predicted to occur (and at what rate) against what is actually seen in the field. This paper will give case studies demonstrating these emerging trends in risk assessment.
  • Keywords
    fault trees; product life cycle management; risk management; FMEA; FRACAS; design phase; fault tree analysis; management team; product concept; product lifecycle; product risk factor minimization; risk assessment; Bills of materials; Companies; Coolants; Market research; Reliability; Risk management; Sensors; FMEA; Fault Tree; Risk Assessment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
  • Conference_Location
    Orlando, FL
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4673-4709-9
  • Type

    conf

  • DOI
    10.1109/RAMS.2013.6517691
  • Filename
    6517691