DocumentCode
2178809
Title
Models and methods for determining storage reliability
Author
Gullo, L.J. ; Mense, A.T. ; Thomas, J.L. ; Shedlock, P.E.
Author_Institution
Raytheon Missile Syst., Tucson, AZ, USA
fYear
2013
fDate
28-31 Jan. 2013
Firstpage
1
Lastpage
6
Abstract
Current dormant storage reliabiliy prediction methods are out dated and may not represent current technology. Some customers are concerned the data supporting the storage reliability prediction method are too old and not reflective of the current technology capability. This paper provides an approach and documents the results of an ongoing case study that uses a binary logistic regression (BLR) model (both classical and Bayesian) to assess recent system failures during non-operating storage and non-operating transportation. Both non-operational and operational system failures were considered in the analysis to determine presence of wear-out mechanisms and degradation, which may cause operational failures. As described in IEEE Std 1413 [1], the usefulness of a reliability prediction is based on how the prediction is developed and how well the prediction is prepared, interpreted, and applied. Reliability predictions are affected by the accuracy and completeness of the information provided to perform the prediction and the methods used to complete the prediction. The benefit of the BLR model is that it provides consistent and repeatable results that provide increased customer confidence in products.
Keywords
Bayes methods; failure analysis; information management; regression analysis; reliability; storage; BLR model; Bayesian model; IEEE Std 1413; binary logistic regression model; customer confidence; degradation; dormant storage reliabiliy prediction method; information completeness; nonoperating storage; nonoperating transportation; nonoperational system failure; operational failure; storage reliability; technology capability; wear-out mechanism; Analytical models; Data models; Degradation; Logistics; Predictive models; Reliability engineering; Binary Logistic Regression (BLR); FRACAS; Storage Reliability; field data;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual
Conference_Location
Orlando, FL
ISSN
0149-144X
Print_ISBN
978-1-4673-4709-9
Type
conf
DOI
10.1109/RAMS.2013.6517704
Filename
6517704
Link To Document