Test pattern generation for multiple output digital circuits using cubical calculus and Boolean differences

Author

Takhar, Jasbir S. ; Gilbert, Daphne J.

Author_Institution

Sch. of Sci. & Math., Sheffield Hallam Univ., UK

Volume

1

fYear

1997

fDate

3-6 Aug 1997

Firstpage

409

Abstract

A new method is presented for generating test patterns for multiple output combinational circuits. Formal mathematical techniques, involving the cubical calculus and Boolean differences, are used to generate test patterns thus dispensing with the costly process of fault simulations. The methods provide the basis for test generation algorithms which are suitable for computer implementation, and also enable testability measures such as observability and controllability, to be computed with relative ease

Keywords

Boolean algebra; automatic testing; combinational circuits; controllability; design for testability; logic design; logic testing; observability; set theory; Boolean differences; combinational circuits; controllability; cubical calculus; mathematical techniques; multiple output digital circuits; observability; test generation algorithms; test pattern generation; test patterns; Calculus; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computational modeling; Controllability; Digital circuits; Observability; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1997. Proceedings of the 40th Midwest Symposium on

Conference_Location

Sacramento, CA

Print_ISBN

0-7803-3694-1

Type

conf

DOI

10.1109/MWSCAS.1997.666121

Filename

666121