Reliability prediction of constant fraction discriminator using modified PoF approach

Author

Thaduri, A. ; Verma, Anil Kumar ; Gopika, V. ; Kumar, Udaya

Author_Institution

Lulea Univ. of Technol., Lulea, Sweden

fYear

2013

fDate

28-31 Jan. 2013

Firstpage

1

Lastpage

7

Abstract

In this paper, the introduction, functioning and importance of constant fraction discriminator in nuclear field was studied. Furthermore, reliability and degradation mechanisms that affects the performance of output pulse with temperature and dose rates acts as input characteristics was properly explained and verified with the experiments. Accelerated testing was carried out to define the life testing of the component with respect to degradation in output TTL pulse amplitude. Time to failure was to be properly quantified and modelled accordingly.

Keywords

failure analysis; life testing; nuclear engineering; reliability; transistor-transistor logic; accelerated testing; constant fraction discriminator; degradation mechanism; input characteristics; life testing; modified PoF approach; nuclear field; output TTL pulse amplitude; output pulse performance; reliability mechanism; reliability prediction; time to failure; Computational fluid dynamics; Degradation; Stress; Temperature; Temperature measurement; Testing; Transistors; Accelerated Testing; Constant Fraction Discriminator; Design of Experiments; Physics of Failure; Radiation testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual

Conference_Location

Orlando, FL

ISSN

0149-144X

Print_ISBN

978-1-4673-4709-9

Type

conf

DOI

10.1109/RAMS.2013.6517746

Filename

6517746