• DocumentCode
    2182
  • Title

    Electron Beam Transverse Longitudinal Dynamics for SASE FEL Operation

  • Author

    Dattoli, G. ; Di Palma, E. ; Petralia, A. ; Quattromini, M.

  • Author_Institution
    ENEA C.R. Frascati, Frascati, Italy
  • Volume
    49
  • Issue
    3
  • fYear
    2013
  • fDate
    Mar-13
  • Firstpage
    267
  • Lastpage
    273
  • Abstract
    We present a procedure based on the combined use of analytical and numerical tools, useful for understanding the relative interplay between the various components of a free electron laser (FEL) self-amplified spontaneous emission (SASE) device. We take as reference case the Sorgente Pulsata Auto-amplificata di Radiazione Coerente (SPARC) experiment to analyze how electron beam transverse matching conditions affect the lasing conditions itself and discuss the possibility of implementing new configurations. In particular we show that the procedure can be extended to account for the effect of an on line inserted cavity, with the role of inducing a transverse longitudinal correlation allowing a transfer of the longitudinal and transverse emittance. We discuss the associated benefit on the FEL operation, with particular reference to the nonlinear harmonic generation. The possibility of completing the tool with regards to the beam degradation effects due to CSR is briefly accounted for.
  • Keywords
    electron beams; free electron lasers; laser beams; laser cavity resonators; optical harmonic generation; superradiance; CSR; SASE FEL; SPARC experiment; Sorgente Pulsata Auto-amplificata di Radiazione Coerente experiment; beam degradation effects; electron beam transverse longitudinal dynamics; free electron laser; nonlinear harmonic generation; self-amplified spontaneous emission; transverse matching; Cavity resonators; Current density; Electron beams; Harmonic analysis; Laser beams; Nonhomogeneous media; Undulators; Beam dynamics; beam optics; free electron laser; self-amplified spontaneous emission;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2013.2238889
  • Filename
    6407666