A potential new frequency/wavelength standard at 778 nm: Doppler free two-photon transitions in rubidium

Author

Millerioux, Y. ; Felder, R. ; Touahri, D. ; Acef, O. ; Hilico, L. ; Clairon, A. ; Biraben, F. ; de Beauvoir, B. ; Julien, L. ; Nez, F.

Author_Institution

CNAM, Inst. National de Metrol., Paris, France

fYear

1994

fDate

June 27 1994-July 1 1994

Firstpage

169

Lastpage

170

Abstract

We have stabilized two laser diodes on the hyperfine components of the 5D/sub 3/2/ and 5D/sub 5/2/ two-photon transitions in natural rubidium (v=385 THz). We have carefully investigated the metrological features of these devices. So far we obtain a frequency stability in terms of the Allan variance of 3.10/sup -13/./spl tau//sup - 1/2 / up to 2000 s and a frequency repeatability of the order of 10/sup -12/. The frequency difference between the two devices is 1.7 kHz under identical operating conditions.<>

Keywords

atomic hyperfine structure; frequency measurement; laser frequency stability; measurement standards; rubidium; semiconductor lasers; two-photon processes; 385 THz; 778 nm; Allan variance; Doppler free two-photon transitions; Rb; frequency repeatability; frequency stability; frequency/wavelength standard; hyperfine components; laser diodes; Diode lasers; Frequency measurement; Gratings; Laser transitions; Magnetic fields; Metrology; Photomultipliers; Spectroscopy; Stability; Temperature control;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on

Conference_Location

Boulder, CO, USA

Print_ISBN

0-7803-1984-2

Type

conf

DOI

10.1109/CPEM.1994.333398

Filename

333398