DocumentCode
2187264
Title
Can clock faults be detected through functional test?
Author
Metra, C. ; Rossi, Davide ; Omana, M. ; Cazeaux, J.M. ; Mak, T.M.
Author_Institution
DEIS, Bologna Univ.
fYear
2006
fDate
18-21 April 2006
Firstpage
166
Lastpage
171
Abstract
We analyze the probability to detect clock faults indirectly through conventional functional testing by considering realistic datapaths derived from ISCAS´85 benchmarks. We show that, even optimistically assuming that we are able to test all short and long paths for min and max delay violations, the detection of clock faults can not be guaranteed, thus mandating new, specific testing approaches for clock faults, otherwise possibly compromising the system correct operation in the field, with dramatic consequences on product quality and defect level
Keywords
clocks; fault diagnosis; integrated circuit testing; clock fault detection; functional testing; max delay violations; min delay violations; Benchmark testing; Calibration; Circuit faults; Clocks; Delay effects; Fault detection; Routing; System testing; Timing; Vehicle crash testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE
Conference_Location
Prague
Print_ISBN
1-4244-0185-2
Type
conf
DOI
10.1109/DDECS.2006.1649606
Filename
1649606
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