• DocumentCode
    2187652
  • Title

    Test Considerations about the Structured ASIC Paradigm

  • Author

    Bernardi, P. ; Grosso, M.

  • Author_Institution
    Dip. Automatica e Informatica, Politecnico di Torino
  • fYear
    2006
  • fDate
    18-21 April 2006
  • Firstpage
    230
  • Lastpage
    231
  • Abstract
    We present a survey on the academic and industrial structured ASIC practices, especially focusing on the test strategies currently in use. Then, we compare two possible test generation flows, underlining the most critical aspects introduced by the adoption of the structured ASIC methodology
  • Keywords
    application specific integrated circuits; automatic test pattern generation; integrated circuit testing; automatic test pattern generation; integrated circuit testing; structured ASIC paradigm; test strategies; Application specific integrated circuits; Circuit synthesis; Circuit testing; Costs; Design for testability; Field programmable gate arrays; Flip-flops; Manufacturing industries; Metallization; Tiles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE
  • Conference_Location
    Prague
  • Print_ISBN
    1-4244-0185-2
  • Type

    conf

  • DOI
    10.1109/DDECS.2006.1649622
  • Filename
    1649622
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2187652