• DocumentCode
    2188937
  • Title

    The effect of scattering on drive current of nanotransistors

  • Author

    Svizhenko, A. ; Anantram, M.P.

  • Author_Institution
    NASA Ames Res. Center, Moffett Field, CA, USA
  • fYear
    2002
  • fDate
    24-26 June 2002
  • Firstpage
    91
  • Lastpage
    92
  • Abstract
    In the nanoscale regime, the electron mean free path is comparable to the transistor channel length. Therefore, the electron transport is neither ballistic nor diffusive as quantum coherence is partially destroyed by scattering on phonons, surface roughness and impurities. In this work we model electron-phonon scattering within a quantum mechanical approach using a non-equilibrium Green´s function method. Based on the calculations, we show that the resistance per unit length in the source side is much larger than in the drain side. Thus, in order to achieve large drive current in nanotransistors, it is important to keep the source extension region short. We model a nanoscale double gate MOSFET as it is an important candidate for a scaled-down transistor.
  • Keywords
    Green´s function methods; MOSFET; electron mean free path; electron-phonon interactions; impurity scattering; nanoelectronics; quantum theory; scattering; semiconductor device models; surface scattering; ballistic/diffusive electron transport; electron mean free path; electron-phonon scattering; large nanotransistor drive current; nanoscale double gate MOSFET; nanotransistor drive current scattering effects; nonequilibrium Green´s function method; phonons/surface roughness/impurity scattering; quantum coherence; quantum mechanics; source extension region length; source/drain side resistance per unit length; transistor channel length; transistor down scaling; Coherence; Electrons; Impurities; MOSFETs; Particle scattering; Phonons; Quantum mechanics; Rough surfaces; Surface resistance; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2002. 60th DRC. Conference Digest
  • Conference_Location
    Santa Barbara, CA, USA
  • Print_ISBN
    0-7803-7317-0
  • Type

    conf

  • DOI
    10.1109/DRC.2002.1029529
  • Filename
    1029529