• DocumentCode
    2189173
  • Title

    Interfacial reaction between the thermopile materials and eutectic Sn-based solders

  • Author

    Li Shen ; Xu, Guangchen ; Zhao, Ran ; Guo, Fu

  • Author_Institution
    Coll. of Mater. Sci. & Eng., Beijing Univ. of Technol., Beijing, China
  • fYear
    2011
  • fDate
    8-11 Aug. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The indium-based solders and bismuth-based solders are commonly employed in soldering the thermopile. Since the wettability between bismuth telluride materials and low melting point alloy solders is poor, a nickel layer was employed on the surface of thermoelectric materials. In this study, in the atmospheric environment, the eutectic Sn-Bi and Sn-In solders spreaded on the p-type thermoelectric respectively without using soldering flux, the corresponding interfacial microstructures were indentified. The interfacial reaction is more sufficient under 300 °C when comparing to that under 250 °C. In addition, a thin nickel layer was deposited on the thermoelectric unit by vapor deposition facility. However, a thin Ni-plated layer on thermoelectric materials might induce severe formation of cracks.
  • Keywords
    bismuth alloys; cracks; crystal microstructure; indium alloys; interface structure; melting point; soldering; solders; surface chemistry; thermoelectricity; tin alloys; wetting; SnBi; SnIn; bismuth telluride materials; cracks; eutectic tin-based solders; interfacial microstructures; interfacial reaction; melting point alloy solders; p-type thermoelectric unit; soldering; soldering flux; thermopile materials; vapor deposition; wettability; Bismuth; Materials; Microstructure; Nickel; Plasma temperature; Scanning electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4577-1770-3
  • Electronic_ISBN
    978-1-4577-1768-0
  • Type

    conf

  • DOI
    10.1109/ICEPT.2011.6067035
  • Filename
    6067035