Title :
In search of a good neuro-genetic computational paradigm
Author :
Srivastava, A.K. ; Srivastava, S.K. ; Shukla, K.K.
Author_Institution :
Dept. of Electron. Eng., Banaras Hindu Univ., Varanasi, India
Abstract :
This paper reports the effect of some advanced genetic operators like two-parents multipoint restricted crossover (Double-MRX), three-parents multipoint restricted crossover (Triple-MRX), elitist selection and scheduled mutation on the adaptability of feedforward neural networks trained over complex and computationally expensive electronic nose data. The authors show that the performance of Triple-MRX is better that of Double-MRX. Upon applying elitist selection with Double-MRX and scheduled mutation with Triple-MRX, the performance of the genetic training of the neural network improves up to some extent, but Triple-MRX is still better than Double-MRX as far as quality of solution and speed of convergence are concerned. It is also shown that the performance levels of these hybrid techniques far exceeds those of the commonly used backpropagation model. The search for a good neuro-genetic hybrid computational paradigm based on advanced genetic operators is a frontier research area in the evolution of a sixth generation computing system.
Keywords :
feedforward neural nets; genetic algorithms; learning (artificial intelligence); Double-MRX; Triple-MRX; advanced genetic operators; computation convergence; computation speed; elitist selection; feedforward neural networks adaptability; genetic training; neuro-genetic computational paradigm; neuro-genetic hybrid computational paradigm; scheduled mutation; sixth generation computing system; three-parents multipoint restricted crossover; two-parents multipoint restricted crossover; Artificial intelligence; Biological cells; Convergence; Electronic mail; Genetic algorithms; Genetic engineering; Genetic mutations; Network topology; Neural networks; Sensor arrays;
Conference_Titel :
Industrial Technology 2000. Proceedings of IEEE International Conference on
Print_ISBN :
0-7803-5812-0
DOI :
10.1109/ICIT.2000.854203