Title :
Analysis of planar transmission lines and microshield lines with arbitrary metallization cross sections using finite elements methods
Author :
Helal, M. ; Legier, J.F. ; Pribetich, P. ; Kennis, P.
Author_Institution :
Inst. d´Electron. et de Microelectronique de Nord, Villeneuve d´Ascq, France
Abstract :
Propagation analysis is proposed to determine with much accuracy as possible, the dispersion characteristics for classical planar structures as well as for the new microstrip and coplanar membrane microshield lines both for microwave and millimeter wave ranges. These transmissions lines present an arbitrary cross section for the metallization of the strips and a finite value of the conductivity. We have developed two formulations of finite element methods in order to simulate such structures in the considered frequency range, showing the influence of lossy strips corner angles.<>
Keywords :
MMIC; finite element analysis; metallisation; microstrip lines; microwave integrated circuits; transmission line theory; MMICs; arbitrary cross section; arbitrary metallization cross sections; classical planar structures; conductivity; coplanar membrane microshield lines; dispersion characteristics; finite element methods; finite elements methods; frequency range; lossy strips corner angles; metallization; microshield lines; microstrip microshield lines; microwave ranges; millimeter wave ranges; planar transmission lines; propagation analysis; transmissions lines; Biomembranes; Conductivity; Coplanar transmission lines; Metallization; Microstrip; Microwave propagation; Millimeter wave propagation; Millimeter wave technology; Planar transmission lines; Strips;
Conference_Titel :
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-1778-5
DOI :
10.1109/MWSYM.1994.335177
