Title :
MMIC oscillator simulation considering bias-voltage dependence
Author :
Gungerich, V. ; Janke, B. ; Zinkler, F. ; Heinrich, W. ; Russer, P.
Author_Institution :
Lehrstuhl fur Hochfrequenztech., Tech. Univ. Munchen, Germany
Abstract :
For two different types of MMIC FET-oscillators, simulation results obtained by state-of-the-art methods of analysis are compared with measurements for a wide range of drain bias-voltage. Quantitatively, agreement is not yet satisfactory for practical applications. The deviations can be attributed not only to uncertainties in the nonlinear FET model but also to inherent properties of the methods of analysis.<>
Keywords :
MMIC; circuit analysis computing; field effect integrated circuits; microwave oscillators; FET-oscillators; MMIC oscillator simulation; bias-voltage dependence; drain bias-voltage; nonlinear FET model; Analytical models; FETs; MMICs; Oscillators;
Conference_Titel :
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-1778-5
DOI :
10.1109/MWSYM.1994.335190
