DocumentCode :
2191584
Title :
Automatic parameter setting for iterative shrinkage methods
Author :
Giryes, Raja ; Elad, Michael ; Eldar, Yonina C.
Author_Institution :
Comput. Sci. Dept., Technion - Israel Inst. of Technol., Haifa, Israel
fYear :
2008
fDate :
3-5 Dec. 2008
Firstpage :
820
Lastpage :
824
Abstract :
Linear inverse problems are very common in signal and image processing. Algorithms that solve such problems typically involve several unknown parameters that need to be tuned. Here we consider an iterated shrinkage method that is based on the separable surrogate functions (SSF) idea, which exploits the sparsity of the unknown vector in an appropriate representation. The key parameter controlling the algorithm¿s success is the prior weight, denoted ¿. Previous work has addressed the automatic tuning of ¿ based on a generalized Stein Unbiased Risk Estimator (SURE) of the mean-squared error (MSE). The approach taken was to obtain a constant value of ¿ that leads to optimized results over a given set of iterations. In this work we also rely on the generalized SURE, and propose an alternative, and highly effective method for tuning ¿. Our algorithm chooses ¿ per iteration, based on the local estimated risk, considering the current iteration and a possible short look-ahead. We demonstrate this method and its superiority over the global approach both in terms of the resulting MSE and the convergence rate. We also show that the proposed scheme serves as a very reliable automatic halting mechanism for the iterative process.
Keywords :
image processing; iterative methods; mean square error methods; automatic halting mechanism; automatic parameter setting; image processing; iterative shrinkage methods; linear inverse problems; mean-squared error; separable surrogate functions idea; signal processing; unbiased risk estimator; Automatic control; Computer science; Convergence; Image processing; Inverse problems; Iterative algorithms; Iterative methods; Noise reduction; Signal processing; Vectors; Inverse problem; Iterated Shrinkage; Separable Surrogate Function; Stein Unbiased Risk Estimator;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Electronics Engineers in Israel, 2008. IEEEI 2008. IEEE 25th Convention of
Conference_Location :
Eilat
Print_ISBN :
978-1-4244-2481-8
Electronic_ISBN :
978-1-4244-2482-5
Type :
conf
DOI :
10.1109/EEEI.2008.4736653
Filename :
4736653
Link To Document :
بازگشت