DocumentCode
2192116
Title
Intermittency events in bio-compatible electrical contacts
Author
McBride, J.W. ; Maul, C.
Author_Institution
Sch. of Eng. Sci., Southampton Univ., UK
fYear
2005
fDate
26-28 Sept. 2005
Firstpage
75
Lastpage
81
Abstract
This paper presents a study of the electrical contact performance of bio-compatible electrical connectors. In particular, the focus is on the performance of these devices under low frequency fretting conditions aimed to replicate the types of motion that may be experienced in-vivo. In the study, the contact materials selected include titanium, stainless-steel and cobalt-chromium alloys in various combinations. These materials are investigated under a unique methodology developed to include the high-frequency sampling of contact resistance values under dry-circuit conditions (20mV) and under low voltage levels of 5V. The experimental methodology is discussed in determining the best standard for continuing studies that compare relative performance. In all tests, the materials exhibit measurable intermittency events, after a low number of fretting cycles. These events are discussed and related to the surface form exhibited and measured using 3D surface scanning methods. The results are then related to theoretical studies of intermittency.
Keywords
biomedical electronics; chromium alloys; cobalt alloys; contact resistance; electric connectors; electrical contacts; materials testing; stainless steel; titanium alloys; wear; 20 mV; 3D surface scanning methods; 5 V; CoCr; Ti; bio-compatible electrical connectors; cobalt-chromium alloys; contact materials; contact resistance values; dry circuit conditions; electrical contacts; high-frequency sampling; intermittency events; low frequency fretting; stainless-steel alloys; titanium alloys; Biological materials; Cobalt alloys; Connectors; Contact resistance; Electrical resistance measurement; Frequency; Low voltage; Materials testing; Sampling methods; Titanium alloys;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 2005. Proceedings of the Fifty-First IEEE Holm Conference on
Print_ISBN
0-7803-9113-6
Type
conf
DOI
10.1109/HOLM.2005.1518226
Filename
1518226
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