Title :
Accuracy of bipolar compact models under RF power operating conditions
Author :
Versleijen, M.P.J.G. ; Bauvin, A.
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
Abstract :
The large-signal accuracy of the SPICE Gummel-Poon and MEXTRAM bipolar compact models for circuit simulation is assessed by means of comparison with 2D large-signal mixed-mode device/circuit simulations under realistic RF power operating conditions. This verification approach eliminates measurement uncertainties and thus concentrates on the intrinsic model behavior. The overall accuracy of both models is found to be quite good. MEXTRAM is more accurate, especially at high-excitation levels.<>
Keywords :
SPICE; bipolar transistors; circuit analysis computing; semiconductor device models; 2D large-signal mixed-mode device; Gummel-Poon model; MEXTRAM model; RF power; SPICE; bipolar compact models; circuit simulation; high-excitation levels; verification; Circuit simulation; Measurement uncertainty; Radio frequency; SPICE;
Conference_Titel :
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-1778-5
DOI :
10.1109/MWSYM.1994.335271
