• DocumentCode
    2193273
  • Title

    Validation of a nonlinear HEMT model by power spectrum characteristics

  • Author

    Angelov, I. ; Zirath, H. ; Rorsman, N.

  • Author_Institution
    Dept. of Microwave Technol., Chalmers Univ. of Technol., Goteborg, Sweden
  • fYear
    1994
  • fDate
    23-27 May 1994
  • Firstpage
    1571
  • Abstract
    The experimental bias dependence of the power output spectrum from various types of HEMT at large signal excitation was studied and compared with predicted values obtained from a newly proposed HEMT model. Good agreement between simulated and measured power spectrum up to at least the fourth harmonic was demonstrated for HEMT devices from different manufacturers. An extension of the existing model is also proposed, which models the V/sub ds/ dependence of the transconductance peak in the region where the drain current is unsaturated and at negative drain voltage.<>
  • Keywords
    high electron mobility transistors; semiconductor device models; fourth harmonic; large signal excitation; nonlinear HEMT model; power output spectrum; simulation; transconductance; HEMTs; Power measurement; Power system harmonics; Predictive models; Transconductance; Virtual manufacturing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1994., IEEE MTT-S International
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-1778-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.1994.335274
  • Filename
    335274