DocumentCode
2193273
Title
Validation of a nonlinear HEMT model by power spectrum characteristics
Author
Angelov, I. ; Zirath, H. ; Rorsman, N.
Author_Institution
Dept. of Microwave Technol., Chalmers Univ. of Technol., Goteborg, Sweden
fYear
1994
fDate
23-27 May 1994
Firstpage
1571
Abstract
The experimental bias dependence of the power output spectrum from various types of HEMT at large signal excitation was studied and compared with predicted values obtained from a newly proposed HEMT model. Good agreement between simulated and measured power spectrum up to at least the fourth harmonic was demonstrated for HEMT devices from different manufacturers. An extension of the existing model is also proposed, which models the V/sub ds/ dependence of the transconductance peak in the region where the drain current is unsaturated and at negative drain voltage.<>
Keywords
high electron mobility transistors; semiconductor device models; fourth harmonic; large signal excitation; nonlinear HEMT model; power output spectrum; simulation; transconductance; HEMTs; Power measurement; Power system harmonics; Predictive models; Transconductance; Virtual manufacturing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location
San Diego, CA, USA
ISSN
0149-645X
Print_ISBN
0-7803-1778-5
Type
conf
DOI
10.1109/MWSYM.1994.335274
Filename
335274
Link To Document