Title :
Punchthrough type GTO with buffer layer and homogeneous low efficiency anode structure
Author :
Eicher, S. ; Bauer, F. ; Weber, A. ; Zeller, H.R. ; Fichtner, W.
Author_Institution :
Integrated Syst. Lab., Swiss Federal Inst. of Technol., Zurich, Switzerland
Abstract :
A new type of full scale 4.5 kV/3 kA GTO has been developed, fabricated, and electrically characterized. The device utilizes a punchthrough concept with a buffer layer. To avoid the requirement of excessive gate currents for turn-on, the new GTO has a homogeneous anode layer without shorts. The anode has a very low efficiency, which allows efficient extraction of charge during turn-off. With the buffer layer, the new device has a significantly reduced wafer thickness as compared to conventional devices without buffer. This reduces switching as well as on-state losses. The turn-off losses of the best devices were reduced to one third of those of conventional GTOs and, at the same time, the on-state losses were decreased by more than one third
Keywords :
losses; power semiconductor switches; thyristors; 3 kA; 4.5 kV; buffer layer; homogeneous low efficiency anode structure; on-state losses; punchthrough type GTO; switching losses; turn-off losses; wafer thickness; Anodes; Buffer layers; Cathodes; Charge carrier processes; Electrons; Silicon; Solids; Thyristors; Voltage;
Conference_Titel :
Power Semiconductor Devices and ICs, 1996. ISPSD '96 Proceedings., 8th International Symposium on
Conference_Location :
Maui, HI
Print_ISBN :
0-7803-3106-0
DOI :
10.1109/ISPSD.1996.509495