Title :
A filamentation-free insulated-gate controlled thyristor and comparisons to the IGBT
Author :
Lilja, Klas ; Fichtner, Wolfgang
Author_Institution :
Integrated Syst. Lab., Eidgenossische Tech. Hochschule, Zurich, Switzerland
Abstract :
An insulated-gate controlled thyristor is presented which has a saturating on-state current characteristic and a stable homogeneous current distribution during turn-on and turn-off. The design of the device and a proposed fabrication-process is discussed. The new device has the robust qualities of the IGBT (current saturation, homogeneous current distribution, insulated gate control), and the four-layer thyristor structure allows for a strong reduction in losses compared to the IGBT. A comparison by simulation for high-voltage devices shows that the losses can be reduced by a factor of 2-3 at 3 kV switching and by a factor of 4 at 6 kV switching, as compared to an optimized planar IGBT structure. We also show simulations comparing the stability of these devices against dynamic avalanche-induced current filamentation instabilities
Keywords :
MOS-controlled thyristors; current distribution; losses; power semiconductor switches; 3 kV; 6 kV; current saturation; dynamic avalanche-induced current filamentation instabilities; filamentation-free insulated-gate controlled thyristor; four-layer thyristor structure; high-voltage devices; losses; saturating on-state current characteristic; stable homogeneous current distribution; turn-off; turn-on; Cathodes; Circuit simulation; Contacts; Electrons; Insulated gate bipolar transistors; Insulation; MOSFET circuits; Switches; Thyristors; Voltage;
Conference_Titel :
Power Semiconductor Devices and ICs, 1996. ISPSD '96 Proceedings., 8th International Symposium on
Conference_Location :
Maui, HI
Print_ISBN :
0-7803-3106-0
DOI :
10.1109/ISPSD.1996.509498