DocumentCode
2194052
Title
Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)
fYear
2002
fDate
12-12 July 2002
Keywords
EPROM; built-in self test; error correction; fault diagnosis; integrated circuit design; integrated circuit reliability; integrated circuit technology; integrated circuit testing; integrated circuit yield; integrated memory circuits; logic testing; EEPROM design; EPROM design; automotive system reliability; embedded memory compilers; embedded memory systems; embedded memory yield enhancement; fault modeling; memory BIST analysis; memory ECC; memory test strategies; process technology; railway system reliability; soft errors; test optimization;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Technology, Design and Testing, 2002. (MTDT 2002). Proceedings of the 2002 IEEE International Workshop on
Conference_Location
Isle of Bendor, France
ISSN
1087-4852
Print_ISBN
0-7695-1617-3
Type
conf
DOI
10.1109/MTDT.2002.1029755
Filename
1029755
Link To Document