Radar backscatter characterization approach combining global TanDEM-X data

Global radar backscatter data can be used for accurate performance estimation and instrument setting optimization for Synthetic Aperture Radar (SAR) systems, e.g. in the TerraSAR-X and TanDEM-X missions. Both missions offer global remote sensing data in order to characterize X-band backscatter by performing a statistical analysis on SAR image quicklooks. A new approach for the estimation of radar backscatter for any polarization, ground classification type and incidence angle is presented, recurring to the use of SAR data coming from the TanDEM-X mission. The introduction of topographical information on the illuminated ground area allows for the discrimination of backscatter samples which are not affected by shadowing and layover, increasing the reliability of the estimation approach. The analysis technique is presented, leading to the generation of a set of X-band backscatter models. First results, obtained using TanDEM-X SAR data, are introduced.