DocumentCode :
2194696
Title :
Automatic Removal of Ocular Artifacts from EEG Signals
Author :
Gao, Junfeng ; Zheng, Chongxun ; Wang, Pei
Author_Institution :
Key Lab. of Biomed. Inf. Eng. of Educ. Minist., Xi´´an Jiaotong Univ., Xi´´an, China
fYear :
2009
fDate :
17-19 Oct. 2009
Firstpage :
1
Lastpage :
5
Abstract :
Electroencephalogram (EEG) signals are often contaminated by ocular artifacts. In present study, a novel and robust technique is presented to eliminate ocular artifacts from EEG signals automatically. Independent component analysis (ICA) method is used to decompose EEG signals. In the first step, the features of topography and power spectral density of those components are extracted. In the second step, we introduce manifold learning algorithm to reduce the dimensionality of initial features. Then, a classifier is used to identify ocular artifacts components. The classifier is selected from several typical classifiers by comparing their classification performances. Classification results show that manifold learning with the nearest neighbor algorithm performs best. Finally, using an example of ocular artifacts removal, we show that the novel technique can effectively remove ocular artifacts with little distortion of underlying brain signals.
Keywords :
electro-oculography; electroencephalography; independent component analysis; learning (artificial intelligence); medical signal processing; signal classification; EEG signals; automatic removal; brain; classification; electroencephalogram signals; electrooculography; independent component analysis; manifold learning algorithm; nearest neighbor algorithm; ocular artifacts; power spectral density; topography; Biomedical engineering; Data mining; Electroencephalography; Electrooculography; Independent component analysis; Nearest neighbor searches; Principal component analysis; Robustness; Source separation; Surfaces;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Engineering and Informatics, 2009. BMEI '09. 2nd International Conference on
Conference_Location :
Tianjin
Print_ISBN :
978-1-4244-4132-7
Electronic_ISBN :
978-1-4244-4134-1
Type :
conf
DOI :
10.1109/BMEI.2009.5305540
Filename :
5305540
Link To Document :
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