DocumentCode :
2195354
Title :
Standard cell library characterization for setting current limits for I/sub DDQ/ testing
Author :
Millman, S.D. ; Acken, J.M.
Author_Institution :
Motorola Inc., Tempe, AZ, USA
fYear :
1996
fDate :
24-25 Oct. 1996
Firstpage :
41
Lastpage :
44
Abstract :
Industry needs to move from a separate step of design for test to solving test issues as an integral part of the design process. The linking of design and test is also needed for I/sub DDQ/ testing, which is required for high quality products. A key issue is how to set the I/sub DDQ/ current limit to detect defective parts without rejecting defect-free parts. Increasing design efforts for accurate standard cell library characterization, especially with respect to power provide the answer. This paper describes a method for setting the I/sub DDQ/ limit based upon cell library characterization. Additionally, the method for iterating in on the final values is reviewed and contrasted with the benefits of the new method.
Keywords :
design for testability; integrated circuit testing; IC; IDDQ testing; current limits; design; standard cell library; Automatic testing; Circuit faults; Circuit testing; Integrated circuit testing; Libraries; Logic testing; Manufacturing; Power supplies; Semiconductor device measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IDDQ Testing, 1996., IEEE International Workshop on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-8186-7655-8
Type :
conf
DOI :
10.1109/IDDQ.1996.557810
Filename :
557810
Link To Document :
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