Title :
16th Asian Test Symposium - Title page
Abstract :
The following topics are dealt with: fault modeling and functional test; fault diagnosis; delay test; test compression; power aware test; DFT; RF test; software test; design verification; SOC test; analog test; test generation; soft error issue; memory test; BIST; current test and analog production test.
Keywords :
automatic test pattern generation; built-in self test; data compression; design for testability; fault diagnosis; system-on-chip; BIST; DFT; RF test; SOC test; analog production test; analog test; current test; delay test; design verification; fault diagnosis; fault modeling; functional test; memory test; power aware test; soft error issue; software test; test compression; test generation;
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-2890-8
