Title :
Layout-Aware Multi-Layer Multi-Level Scan Tree Synthesis
Author :
Wang, Sying-Jyan ; Li, Xin-Long ; Li, Katherine Shu-Min
Author_Institution :
Nat. Chung Hsing Univ., Taichung
Abstract :
In this paper, we propose a layout-aware scan tree synthesis methodology. Scan tree can greatly reduce test data volume, which is very desirable in SOC testing. However, previous researches on scan tree synthesis have not considered routing issues in physical design, which may create a tree with excessively long routing path. In this paper we present a multi-layer multi-level scan tree synthesis method, in which both data compression and routing length are taken into account. Experimental results show that the proposed test method achieves high compression rate with limited routing overhead.
Keywords :
data compression; high level synthesis; integrated circuit layout; integrated circuit testing; logic testing; network routing; system-on-chip; SOC testing; VLSI; data compression; layout-aware scan tree synthesis; multilayer multilevel scan tree synthesis; routing path; Broadcasting; Computer science; Data compression; Flip-flops; Multiplexing; Power engineering and energy; Routing; Switches; Test data compression; Testing;
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-2890-8
DOI :
10.1109/ATS.2007.37