Title :
Fourier Spectrum-Based Signature Test: A Genetic CAD Toolbox for Reliable RF Testing Using Low-Performance Test Resources
Author :
Srinivasan, G. ; Chatterjee, Avhishek ; Natarajan, Vivek
Author_Institution :
Texas Instrum. Inc, Dallas
Abstract :
At the present time, coordinated EDA tools for RF/mixed-signal pin test do not exist. In this paper, a CAD tool for efficient production testing of high- performance RF systems using low-cost baseband ATE is presented The CAD tool consists of a custom developed genetic ATPG for spectral (Fourier spectrum) signature-based alternate (to full specification-based tests) test of RF systems and involves co-simulation of scalable behavioral-level models of the RF System-Under-Test, baseband ATE test instrumentation, loadboard resources, and DfT resources for fast test vector optimization/generation. The CAD tool also enables the evaluation of various low-cost ATE architectures on the impact of the generated tests to provide a cost-effective solution.
Keywords :
automatic test equipment; automatic test pattern generation; circuit CAD; integrated circuit testing; radiofrequency integrated circuits; ATE; ATPG; Fourier spectrum; RF system under test; genetic CAD toolbox; loadboard resources; low performance test resources; reliable RF testing; signature test; test instrumentation; Automatic test pattern generation; Baseband; Circuit testing; Costs; Electronic design automation and methodology; Genetics; Instruments; Radio frequency; Sequential analysis; System testing;
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-2890-8
DOI :
10.1109/ATS.2007.98
