Title :
An Accurate Analysis of Microprocessor Design Verification
Author :
Shen, Haihua ; Zhang, Heng
Author_Institution :
Chinese Acad. of Sci., Beijing
Abstract :
Comparing with the passion for verification technical innovations, the practical verification experiences especially the bug reports and analyses rarely appear in public research. It is very important to analyze the practical bug reports for feedback on the future verification. Thanks to the sufficient design scale of our microprocessor and efficient verification environment we developed, we are able to present in this paper an extensive analysis of the effects of bugs on different design stages and different microarchitectures. The analysis approaches and results are valuable for estimating the distribution of bugs in a microprocessor design and preventing the project from verification bottlenecks.
Keywords :
electronic engineering computing; microprocessor chips; electronic engineering computing; microprocessor design verification; practical bug report analysis; CMOS technology; Computer bugs; Design engineering; Feedback; Microarchitecture; Microprocessors; Out of order; Technological innovation; Testing; Vehicle dynamics;
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-2890-8
DOI :
10.1109/ATS.2007.95