DocumentCode :
2197898
Title :
Accounting for singles rate related phenomena in PET Monte Carlo-based simulations
Author :
Reilhac, Anthonin ; Lartizien, Carole ; Costes, Nicolas ; Sans, Sylvain ; Comtat, Claude ; Evans, Alan
Author_Institution :
Montreal Neurological Inst. & Hosp., McGill Univ., Montreal, Que., Canada
Volume :
3
fYear :
2002
fDate :
10-16 Nov. 2002
Firstpage :
1617
Abstract :
Monte Carlo-based PET simulators are powerful tools to accurately generate projections of tracer distributions given scanner specifications and attenuating media distribution. Most of the available programs aim at simulating only the scattered and unscattered components of the PET signal and do not account for singles rate related phenomena such as random events and event losses that may occur at different levels of the event detection and data processing steps. In fact, such an algorithm would involve a dramatic increase in computation time. We have developed a model which gives the rate of the detected singles for each block of the scanner across time, according to the known activity levels and distributions of the different structures. We have integrated our singles rate model into an existing PET Monte Carlo simulator and validated the whole process against measured count rate performances. Simulated and measured data were found to be in good agreement.
Keywords :
Monte Carlo methods; positron emission tomography; radioactive tracers; PET Monte Carlo-based simulations; attenuating media distribution; count rate performances; random events; scanner specifications; singles rate related phenomena; tracer distributions; Computational modeling; Data processing; Discrete event simulation; Event detection; Monte Carlo methods; Performance evaluation; Positron emission tomography; Power generation; Scattering; Signal processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2002 IEEE
Print_ISBN :
0-7803-7636-6
Type :
conf
DOI :
10.1109/NSSMIC.2002.1239632
Filename :
1239632
Link To Document :
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