• DocumentCode
    2198033
  • Title

    An Efficient Diagnostic Test Pattern Generation Framework Using Boolean Satisfiability

  • Author

    Zheng, Feijun ; Cheng, Kwang-Ting ; Yan, Xiaolang ; Moondanos, John ; Hanna, Ziyad

  • Author_Institution
    Zhejiang Univ., Hangzhou
  • fYear
    2007
  • fDate
    8-11 Oct. 2007
  • Firstpage
    288
  • Lastpage
    294
  • Abstract
    This paper presents a diagnostic test pattern generation (DTPG) framework based upon a Boolean Satisfiability engine. We first propose an enhanced miter-based model for distinguishing fault candidates that can achieve greater efficiency as well as can prove a group of undifferentiable faults. The model can also be used to generate diagnostic tests for distinguishing faults of different fault types. Based on this model, we propose a diagnostic pattern compaction strategy. By exploring "don\´t cares " at the primary inputs, the number of required diagnostic patterns can be reduced. Experimental results show that the proposed method achieves a greater diagnosis resolution when combined with existing approaches. Also, fewer diagnostic test patterns are needed.
  • Keywords
    Boolean functions; automatic test pattern generation; computability; logic testing; Boolean satisfiability; diagnostic test pattern generation; fault candidates; stuck-at faults; Circuit faults; Circuit testing; Compaction; Engines; Failure analysis; Fault diagnosis; Multiplexing; Test pattern generators; USA Councils; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2007. ATS '07. 16th
  • Conference_Location
    Beijing
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-2890-8
  • Type

    conf

  • DOI
    10.1109/ATS.2007.80
  • Filename
    4388027