• DocumentCode
    2199065
  • Title

    Assessing and mapping crop vulnerability due to sudden cooling using time series satellite data

  • Author

    Dong, Yansheng ; Chen, Hongping ; Gu, Xiaohe ; Wang, Jihua ; Cui, Bei

  • Author_Institution
    Beijing Res. Center for Inf. Technol. in Agric., Beijing, China
  • fYear
    2012
  • fDate
    22-27 July 2012
  • Firstpage
    2990
  • Lastpage
    2993
  • Abstract
    Sudden cooling during the crop growing phase seriously impacts crop growth. Crop vulnerability to low temperature stress is affected both by crop growing condition and the lowest environmental temperature. In this study taking winter wheat in Huang-Huai-Hai Plain of China as an example, vulnerability index to low temperature stress was assessed based on time series satellite data in nearly ten years. Growth sensitivity of wheat-frost was quantified by vegetation index change between tillering stage before winter and shooting stage in the next year. Exposure index of wheat-frost was defined as lowest land surface temperature during critical growth period. Cluster analysis of crop mean vulnerability index showed that high vulnerability of wheat-frost located in central and northern of Hebei Province in nearly 10 years. The result will help to prevent frost damage of winter wheat.
  • Keywords
    atmospheric boundary layer; atmospheric temperature; crops; pattern clustering; statistical analysis; time series; vegetation mapping; China; Hebei province; Huang-Huai-Hai plain; cluster analysis; crop growing condition; crop growing phase; crop mean vulnerability index; crop vulnerability assessment; crop vulnerability mapping; environmental temperature; low temperature stress vulnerability index; sudden cooling; time series satellite data; wheat frost growth sensitivity; winter wheat; Agriculture; Cooling; Indexes; MODIS; Sensitivity; Stress; Temperature sensors; MODIS; Sudden cooling; frost; growth sensitivity; vulnerability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2012 IEEE International
  • Conference_Location
    Munich
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4673-1160-1
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2012.6350797
  • Filename
    6350797