• DocumentCode
    21996
  • Title

    Thermal Sensor Using Poly-Si Thin-Film Transistors With Self-Aligned and Offset Gate Structures

  • Author

    Kimura, Mizue ; Taya, J. ; Nakashima, A. ; Sagawa, Y.

  • Author_Institution
    Dept. of Electron. & Inf., Ryukoku Univ., Otsu, Japan
  • Volume
    13
  • Issue
    5
  • fYear
    2013
  • fDate
    May-13
  • Firstpage
    1771
  • Lastpage
    1774
  • Abstract
    We propose a thermal sensor using poly-Si thin-film transistors (TFTs) with self-aligned and offset gate structures. First, the temperature dependences of the transistor characteristic are compared between the self-aligned and offset TFTs. It is found that both the TFTs have the temperature dependence of the off-leakage current, whereas the off-leakage current of the self-aligned TFT is larger than that of the offset TFT. Next, the self-aligned and offset TFTs are included in a cell circuit to detect the temperature utilizing the off-leakage current, which is composed of a pair of 1-transistor and 1-capacitor. It is found that low and high temperatures can be detected using the self-aligned and offset TFTs, respectively. We think that it is promising to integrate this thermal sensor in certain applications using TFTs.
  • Keywords
    elemental semiconductors; silicon; temperature sensors; thin film transistors; 1-capacitor; 1-transistor; Si; off-leakage current; offset TFT; offset gate structures; poly-TFT; polythin-film transistors; self-aligned TFT; self-aligned gate structures; temperature dependences; thermal sensor; Temperature; Temperature dependence; Temperature measurement; Temperature sensors; Thin film transistors; Off-leakage current; offset gate; poly-Si; self-aligned gate; temperature; thermal sensor; thin-film transistor (TFT);
  • fLanguage
    English
  • Journal_Title
    Sensors Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1530-437X
  • Type

    jour

  • DOI
    10.1109/JSEN.2013.2241952
  • Filename
    6416914