• DocumentCode
    2199705
  • Title

    Identification of faulty insulators by using corona discharge analysis based on artificial neural network

  • Author

    Li, C.R. ; Shi, Q. ; Cheng, Y.C. ; Yu, Chen ; Yichao, Yuan

  • Author_Institution
    Dept. of Electr. Eng., North China Electr. Power Univ., Qinghe, China
  • Volume
    2
  • fYear
    1998
  • fDate
    7-10 Jun 1998
  • Firstpage
    382
  • Abstract
    It was found from the tests in our laboratory that statistic analysis of insulator corona current pulses could identify the existence of faulty insulators on strings or transmission line towers. Some basic researches on corona discharge characteristics of insulators and insulator strings were investigated further in terms of polarity, amplitude, and pulse count of corona current pulses. Insulator corona characteristics are observed to be different from piece to piece. Therefore, a BP network was developed to classify voltage across an insulator and further identify the existence of faulty insulators on towers. It is confirmed that the developed BP network method yields satisfactory performance in terms of training time and quality of classification
  • Keywords
    backpropagation; charge measurement; corona; diagnostic expert systems; fault location; insulator testing; poles and towers; porcelain insulators; power engineering computing; power transmission lines; BP network; artificial neural network; classification; corona discharge analysis; corona discharge characteristics; faulty insulators; identification; insulator corona current pulses; insulator strings; insulators; polarity; porcelain insulator; pulse count; statistic analysis; strings; tests; training time; transmission line towers; Corona; Current measurement; Dielectrics and electrical insulation; Fault diagnosis; Insulator testing; Laboratories; Poles and towers; Power transformer insulation; Pulse measurements; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1998. Conference Record of the 1998 IEEE International Symposium on
  • Conference_Location
    Arlington, VA
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-4927-X
  • Type

    conf

  • DOI
    10.1109/ELINSL.1998.694814
  • Filename
    694814