DocumentCode
2200465
Title
Single event effect testing of the Intel 80386 family and the 80486 microprocessor
Author
Moran, A. ; LaBel, K. ; Gates, M. ; Seidleck, C. ; McGraw, R. ; Broida, M. ; Firer, J. ; Sprehn, S.
Author_Institution
NASA Goddard Space Flight Center, Greenbelt, MD, USA
fYear
1995
fDate
18-22 Sep 1995
Firstpage
263
Lastpage
269
Abstract
We present single event effect test results for the Intel 80386 microprocessor, the 80387 coprocessor, the 82380 peripheral device, and on the 80486 microprocessor. Both single event upset and latchup conditions were monitored
Keywords
CMOS digital integrated circuits; computer testing; integrated circuit testing; microprocessor chips; space vehicle electronics; CMOS; Intel 80386 family; Intel 80486 microprocessor; coprocessor; latchup conditions; peripheral device; single event effect testing; spaceflight missions; Circuit testing; Clocks; Control systems; Coprocessors; Costs; Manufacturing processes; Microprocessors; NASA; Performance evaluation; Single event upset;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on
Conference_Location
Arcachon
Print_ISBN
0-7803-3093-5
Type
conf
DOI
10.1109/RADECS.1995.509788
Filename
509788
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