• DocumentCode
    2200982
  • Title

    Transverse line parameters of coupled microstrips on a lossy substrate

  • Author

    Assante, Dario ; Verolino, Luigi

  • Author_Institution
    Department of Electrical Engineering, University of Naples ¿Federico II¿, Via Claudio 21, I-80123 Napoli, Italy
  • fYear
    2007
  • fDate
    24-28 Sept. 2007
  • Firstpage
    305
  • Lastpage
    308
  • Abstract
    This paper deals with the evaluation of the frequencydependent transverse line parameters C and G of coupled microstrips on a lossy substrate. The proposed full wave approach, combined with the use of the Neumann series, allows a simple and fast computing solution of the problem and accurately takes into account the proximity effect between the microstrips. The method can also be useful for the validation of simple closed-form expressions.
  • Keywords
    Circuit simulation; Closed-form solution; Conductivity; Current density; Frequency; Geometry; Integrated circuit interconnections; Microstrip; Proximity effect; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2007. EMC Zurich 2007. 18th International Zurich Symposium on
  • Conference_Location
    Munich, Germany
  • Print_ISBN
    978-3-9523286-1-3
  • Electronic_ISBN
    978-3-9523286-0-6
  • Type

    conf

  • DOI
    10.1109/EMCZUR.2007.4388256
  • Filename
    4388256
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2200982