• DocumentCode
    2201162
  • Title

    A simple model for calculating proton induced SEU

  • Author

    Barak, J. ; Levinson, J. ; Akkerman, A. ; Lifshitz, Y. ; Victoria, M.

  • Author_Institution
    Soreq Nucl. Res. Center, Yavne, Israel
  • fYear
    1995
  • fDate
    18-22 Sep 1995
  • Firstpage
    431
  • Lastpage
    436
  • Abstract
    A new semi-empirical model for proton induced SEU is presented. For estimating the energy deposited by the protons in the sensitive volumes of the devices the model uses the measured spectra of surface barrier detectors (SBD) with the same thicknesses of the sensitive volume and at the same proton energies. Fitting the SBD spectra by exponential functions and the heavy ion induced cross sections by simple formulas results in simple expressions for the proton cross sections. The model predictions are in good agreement with the experimental results
  • Keywords
    proton effects; semiconductor counters; semiconductor device models; SBD spectra; cross section; energy deposition; exponential function; proton induced SEU; semi-empirical model; surface barrier detector; Alpha particles; Detectors; Energy measurement; Extraterrestrial measurements; Nuclear electronics; Phase measurement; Protons; Single event upset; Thickness measurement; Volume measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on
  • Conference_Location
    Arcachon
  • Print_ISBN
    0-7803-3093-5
  • Type

    conf

  • DOI
    10.1109/RADECS.1995.509815
  • Filename
    509815