• DocumentCode
    2201484
  • Title

    Application of dual-input PSS to 343 MVA pumped storage unit and its validation

  • Author

    Kim, Dong-Joon ; Moon, Young-Hwan ; Kim, Ho-Yong ; Shin, Jeong-Hoon ; Kim, Tae-Kyun

  • Author_Institution
    KERI, Changwon, South Korea
  • fYear
    2004
  • fDate
    10-10 June 2004
  • Firstpage
    1755
  • Abstract
    This work describes practical tuning methods and testing of a dual-input prototype PSS, which uses both frequency and power, with the 343 MVA Muju P/P #2 in the KEPCO system to enhance the damping of both local and inter-area modes. A Bode plot was drawn to tune the PSS´s time constants to compensate for phase lag. In addition, eigenvalue analysis was used to determine a reliable PSS gain, Ks, and a time-domain transient program was used to verify safe operation of the PSS in the presence of predictable disturbances, such as the AVR step test and generator unloading. In the on-site test, the AVR step tests at 300 MW loading at Muju P/P #2 were implemented with a dual-input prototype PSS to check to what extent the PSS damped the power oscillation of the disturbances. The recorded data showed that power oscillations were reduced considerably as the PSS gain was increased.
  • Keywords
    Bode diagrams; damping; eigenvalues and eigenfunctions; oscillations; pumped-storage power stations; time-domain analysis; tuning; voltage regulators; 300 MW; 343 MVA; AVR; Bode plot; KEPCO system; automatic voltage regulator; damping; dual-input PSS; dual-input prototype; eigenvalue analysis; generator unloading; local-inter area modes; phase lag compensation; power oscillation; power system reliability; power system stabilizer gain; practical tuning methods; pumped storage unit; time-domain transient program; Damping; Eigenvalues and eigenfunctions; Frequency; Power generation; Power system transients; Power systems; Prototypes; Testing; Time domain analysis; Tuning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Engineering Society General Meeting, 2004. IEEE
  • Conference_Location
    Denver, CO
  • Print_ISBN
    0-7803-8465-2
  • Type

    conf

  • DOI
    10.1109/PES.2004.1373178
  • Filename
    1373178