SEE data from the APEX Cosmic Ray Upset Experiment: predicting the performance of commercial devices in space

Author

Adolphsen, John ; Barth, Janet L. ; Stassinopoulos, E.G. ; Gruner, Timothy ; Wennersten, Miriam ; LaBel, Kenneth A. ; Seidleck, Christina M.

Author_Institution

UNISYS, Lantham, MD, USA

fYear

1995

fDate

18-22 Sep 1995

Firstpage

572

Lastpage

580

Abstract

This paper presents additional results from the CRUX experiment on the US Air Force APEX satellite. The experiment monitors single event effects on 256 Kbit and 1 Mbit SRAMs. It is shown that trapped protons dominate the single event upset rates, as evidenced by correlation with measured proton flux peaks and with flux contours calculated with the AP8 model. The responses of some part type lots were surprising because of the wide variation exhibited in upset rates from device to device within a part type, and because of a wide disparity in upset rates, depending on logic state. The use of generic ground test data in error rate predictions for a mission may be acceptable, but may also result in answers whose inaccuracies are unknown and could be unacceptably large

Keywords

SRAM chips; artificial satellites; cosmic ray interactions; proton effects; space vehicle electronics; 1 Mbit; 256 Kbit; AP8 model; CRUX; Cosmic Ray Upset Experiment; SEE; SRAM; USAF APEX satellite; logic state; single event upsets; space device; trapped protons; Aerospace electronics; Error analysis; Extraterrestrial measurements; Logic devices; Orbits; Particle measurements; Protons; Satellites; Single event upset; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on

Conference_Location

Arcachon

Print_ISBN

0-7803-3093-5

Type

conf

DOI

10.1109/RADECS.1995.509839

Filename

509839