Title :
Development of a miniature cold-cathode electron gun
Author :
Menz, D.M. ; Velazco, J.E. ; Ceperley, P.H.
Author_Institution :
Microwave Technols. Inc., Fairfax, VA, USA
Abstract :
Summary form only given, as follows. Microwave Technologies Incorporated is developing a miniature cold cathode electron gun (MCEG) prototype as a potential replacement for conventional thermionic cathodes. The MCEG employs Pierce-type geometry and uses microscopic silicon cathode for the generation of a good-quality high-current-density electron beam. We will report on a MCEG proof-of-principle experiment which is designed for the generation of a 5 kV, 50 mA electron beam. The status of our test bed assembly and of our data acquisition system will be presented. We will also report on the experimental emission testing of different field-emitter-array cathodes tested in our system. When compared to conventional thermionic electron guns, the MCEG offers a substantial reduction in size and weight and avoids the use of heating elements. The electron gun prototype under development has an immense number of applications such as the next generation of microwave tubes, electron microscopes, high-definition television, spectrometers, flat panel displays, as well as industrial and medical accelerators.
Keywords :
cold-cathode tubes; electron guns; microwave tubes; thermionic cathodes; vacuum microelectronics; Pierce-type geometry; data acquisition system; electron microscopy; field-emitter-array cathodes; flat panel displays; good-quality high-current-density electron beam generation; high-definition television; industrial accelerators; medical accelerators; microscopic Si cathode; microwave tubes; miniature cold-cathode electron gun; test bed assembly; thermionic cathodes; thermionic electron guns; Assembly systems; Cathodes; Electromagnetic heating; Electron beams; Electron microscopy; Geometry; Microwave technology; Prototypes; Silicon; System testing;
Conference_Titel :
Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-5982-8
DOI :
10.1109/PLASMA.2000.854746