Title :
On-line monitor design of finite-state machines
Author :
Gao, Feng ; Hayes, John P.
Author_Institution :
Adv. Comput. Archit. Lab., Michigan Univ., Ann Arbor, MI, USA
Abstract :
On-line monitoring is a useful technique for ensuring system reliability. By continuously supervising the system´s operation, a wide range of problems, such as physical defects, transient faults and design errors, can be detected A monitor M*´s behavior can be viewed as an abstraction of the target system M´s behavior, and can be represented by a homomorphic mapping from M to M*. We present a systematic procedure to select homomorphisms and measure their costs. Experimental results are also presented which quantify some basic trade-offs between area overhead and fault coverage.
Keywords :
built-in self test; data flow graphs; fault simulation; finite state machines; logic CAD; logic testing; BIST; abstraction algorithm; area overhead; current-next-state-exchange faults; current-state-change faults; design errors; fault coverage; finite-state machine; heuristic algorithm; homomorphisms; next-state-change faults; on-line monitor design; state dependency graph; system model; system reliability; transient faults; Condition monitoring; Conferences; Testing;
Conference_Titel :
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Print_ISBN :
0-7695-1641-6
DOI :
10.1109/OLT.2002.1030187