• DocumentCode
    2205231
  • Title

    Reviews and Prospects of Low-Voltage Nano-Scale Embedded RAMs

  • Author

    Itoh, Kiyoo

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    73
  • Lastpage
    77
  • Abstract
    Low-voltage nanoscale embedded RAMs are described, focusing on RAM cells and peripheral circuits. First, challenges and trends of low-voltage RAM cells are discussed in terms of signal charge, signal voltage, and noise. ECC to cope with the ever-increasing soft-error rate, power-supply controls to widen the voltage margin of cells, and a fully-depleted SOI to reduce VT-variation are also investigated. Then peripheral circuits are explained in terms of leakage reduction and compensation for speed variations. Based on this, it is concluded that low-voltage RAMs cannot be achieved without reducing speed variations caused by variations in VT, thus resulting in a further need for compensation circuits and new devices with reduced VT variation
  • Keywords
    embedded systems; leakage currents; low-power electronics; nanoelectronics; random-access storage; silicon-on-insulator; ECC; RAM cells; compensation circuit; fully-depleted SOI; leakage reduction; low-voltage nanoscale embedded RAM; peripheral circuit; power-supply control; signal charge; signal voltage; soft-error rate; speed variation compensation; Capacitors; Circuit noise; Leakage current; Parasitic capacitance; Power dissipation; Random access memory; Signal design; Subthreshold current; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2006 25th International Conference on
  • Conference_Location
    Belgrade
  • Print_ISBN
    1-4244-0117-8
  • Type

    conf

  • DOI
    10.1109/ICMEL.2006.1650899
  • Filename
    1650899