Title :
High-level synthesis for testability
Author :
Marzouki, M. ; Alves, V. Castro ; Antunes, A. Ribeiro
Author_Institution :
TIMA/INPG, Grenoble, France
Abstract :
Progress in synthesis development has made commercially available tools that allow automatic synthesis of designs, starting from their RTL description. More recently, some tools even starting from the behavioral description have appeared on the market. However, the synthesized designs an rather hard to test. What is commonly achieved is to add testability features at the gate level, after the synthesis process has been done, which results in high area overhead and poor design performances. A lot of research work is currently on-going trying to take into account testability features at higher levels, that is, RTL or even behavioral level. We propose a general framework for an efficient high-level synthesis or testability methodology
Keywords :
circuit CAD; design for testability; high level synthesis; integrated circuit design; integrated circuit testing; logic testing; RTL description; automatic synthesis; behavioral description; high-level synthesis; synthesis for testability; testability methodology; Automatic testing; Control system synthesis; Costs; Design for testability; High level synthesis; Libraries; Network synthesis; Performance evaluation; Software testing; System testing;
Conference_Titel :
Circuits and Systems, 1995., Proceedings., Proceedings of the 38th Midwest Symposium on
Conference_Location :
Rio de Janeiro
Print_ISBN :
0-7803-2972-4
DOI :
10.1109/MWSCAS.1995.510190