DocumentCode
2206697
Title
A novel inversion algorithm for optical tomography of plasmas
Author
Etemadi, K. ; Benck, E.C.
Author_Institution
Dept. of Electr. Eng., State Univ. of New York, Buffalo, NY, USA
fYear
2000
fDate
4-7 June 2000
Firstpage
181
Abstract
Summary form only given. In plasma emission and absorption spectroscopy, there is a strong demand to reconstruct the plasma distribution from the side-on intensity measurements. While Abel inversion is commonly used for axially symmetric plasmas, tomographic reconstruction techniques are necessary for asymmetric plasmas. Filtered back projection algorithm is mostly used for medical X-ray imaging. However, model function fitting, algebraic reconstruction technique (ART), or Tikhonov regularization are more appropriate for optical diagnostic techniques, where optical access to source is limited by the vacuum chamber viewports. This is an iterative technique which utilizes an a least square fit of exponential functions to the intersection of the measurement line-of-sights. In each iteration, the emissivities at the intersection points are adjusted to reduce the difference between the line integrated experimental measurements and the line integrated theoretical values obtained by the previous least squared exponential curve fit. Additional conditions placed on the plasma distribution were that the emissivities have positive values in the plasma and approach zero at the boundaries. An observation geometry comprised of two perpendicular fans was investigated to simulate the experimental setup.
Keywords
iterative methods; least squares approximations; optical tomography; plasma diagnostics; Abel inversion; Tikhonov regularization; algebraic reconstruction technique; asymmetric plasmas; axially symmetric plasmas; exponential functions; filtered back projection algorithm; inversion algorithm; iterative technique; least square fit; line-of-sights measurement; medical X-ray imaging; model function fitting; optical diagnostic techniques; optical tomography; plasma absorption spectroscopy; plasma distribution; plasma emission spectroscopy; plasmas; side-on intensity measurements; tomographic reconstruction techniques; vacuum chamber viewports; Biomedical optical imaging; Image reconstruction; Optical filters; Plasma diagnostics; Plasma measurements; Plasma simulation; Plasma sources; Plasma x-ray sources; Stimulated emission; Tomography;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
Conference_Location
New Orleans, LA, USA
ISSN
0730-9244
Print_ISBN
0-7803-5982-8
Type
conf
DOI
10.1109/PLASMA.2000.854917
Filename
854917
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