Title :
Built-in self-test approaches for analogue and mixed-signal integrated circuits
Author :
Mir, S. ; Lubaszewski, M. ; Liberali, V. ; Courtois, B.
Author_Institution :
TIMA, Grenoble, France
Abstract :
The increasing complexity of analogue/mixed-signal integrated circuits is leading test engineers to propose self-test capabilities for these types of circuits. The use of on-chip structures for the test of analogue and mixed-signal parts allows for significant savings in expensive test equipment and reduces the chip cost. This field has been the subject of substantial research over the last few years. This paper presents a survey of the most significant analogue and mixed-signal built-in self-test approaches
Keywords :
analogue integrated circuits; built-in self test; economics; integrated circuit manufacture; integrated circuit testing; mixed analogue-digital integrated circuits; analogue integrated circuits; built-in self-test approaches; chip cost; mixed-signal integrated circuits; on-chip structures; self-test capabilities; Analog-digital conversion; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Hardware; Integrated circuit testing; Mixed analog digital integrated circuits; Test equipment;
Conference_Titel :
Circuits and Systems, 1995., Proceedings., Proceedings of the 38th Midwest Symposium on
Conference_Location :
Rio de Janeiro
Print_ISBN :
0-7803-2972-4
DOI :
10.1109/MWSCAS.1995.510298
