Title :
EMI modeling of switching circuits via augmented equivalents and measured data
Author :
Trinchero, Riccardo ; Stievano, Igor S. ; Canavero, Flavio G.
Author_Institution :
EMC Group, Department of Electronics and Telecommunications, Politecnico di Torino, Corso Duca degli Abruzzi 24, 10129, Italy
Abstract :
This paper presents an innovative modeling technique for the prediction of the conducted emissions generated by switching circuits. The proposed approach accounts for the inherent time-varying nature of the above class of circuits by means of an augmented impedance or admittance one-port representation estimated from real measurements. The above interpretation yields to an improved accuracy with respect to the state-of-the-art modeling approaches based on linear time-invariant surrogates and allows for the full characterization of the conducted disturbances via a well-defined modeling procedure. The strength of the method is verified on a real dc-dc boost converter.
Keywords :
Admittance; Electromagnetic compatibility; Electromagnetic interference; Integrated circuit modeling; Linear systems; Switching circuits; Voltage measurement;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2015 IEEE International Symposium on
Conference_Location :
Dresden, Germany
Print_ISBN :
978-1-4799-6615-8
DOI :
10.1109/ISEMC.2015.7256145