DocumentCode :
2209095
Title :
Location and Scatter Matching for Dataset Shift in Text Mining
Author :
Chen, Bo ; Lam, Wai ; Tsang, Ivor ; Wong, Tak-Lam
Author_Institution :
Chinese Univ. of Hong Kong, Hong Kong, China
fYear :
2010
fDate :
13-17 Dec. 2010
Firstpage :
773
Lastpage :
778
Abstract :
Dataset shift from the training data in a source domain to the data in a target domain poses a great challenge for many statistical learning methods. Most algorithms can be viewed as exploiting only the first-order statistics, namely, the empirical mean discrepancy to evaluate the distribution gap. Intuitively, considering only the empirical mean may not be statistically efficient. In this paper, we propose a non-parametric distance metric with a good property which jointly considers the empirical mean (Location) and sample covariance (Scatter) difference. More specifically, we propose an improved symmetric Stein´s loss function which combines the mean and covariance discrepancy into a unified Bregman matrix divergence of which Jensen-Shannon divergence between normal distributions is a particular case. Our target is to find a good feature representation which can reduce the distribution gap between different domains, at the same time, ensure that the new derived representation can encode most discriminative components with respect to the label information. We have conducted extensive experiments on several document classification datasets to demonstrate the effectiveness of our proposed method.
Keywords :
covariance analysis; data mining; feature extraction; nonparametric statistics; Bregman matrix divergence; Jensen Shannon divergence; covariance discrepancy; dataset shift; distribution gap; empirical mean discrepancy; feature representation; location matching; nonparametric distance metric; sample covariance difference; scatter matching; statistical learning; symmetric Stein loss function; text mining; Domain Adaptation; Feature Extraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Data Mining (ICDM), 2010 IEEE 10th International Conference on
Conference_Location :
Sydney, NSW
ISSN :
1550-4786
Print_ISBN :
978-1-4244-9131-5
Electronic_ISBN :
1550-4786
Type :
conf
DOI :
10.1109/ICDM.2010.72
Filename :
5694037
Link To Document :
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