Applications of self-organizing maps (SOM) to the composition determination of chemical products

Author

Tokutaka, Heizo ; Yoshihara, Kazuhiro ; FujiMura, Kikuo ; Iwamoto, Kazuyuki ; Watanabe, Toru ; Kishida, Satoru

Author_Institution

Dept. of Electr. & Electron. Eng., Tottori Univ., Japan

Volume

1

fYear

1998

fDate

4-8 May 1998

Firstpage

301

Abstract

Self-organizing maps (SOM) method was developed by Kohonen (1997) was first applied to the problems of chemical analysis, such as AES (Auger electron spectroscopy), XPS (X-ray photoelectron spectroscopy), and XRD (X-ray diffraction) data. Using the constructed 2-dimensional SOM, it became clear that the things which are described quantitatively by linguistic expressions can be explained more quantitatively by the position of the spectra data on the SOM as well as with a gray level expression. Also, the composition of the unknown spectra can be determined very precisely by the SOM, which is constructed using the composition of the known spectra

Keywords

Auger effect; X-ray diffraction; X-ray photoelectron spectra; chemical analysis; chemical engineering computing; electron spectroscopy; self-organising feature maps; 2D SOM; AES; Auger electron spectroscopy; X-ray diffraction; X-ray photoelectron spectroscopy; XPS; XRD; chemical products; composition determination; gray level expression; self-organizing maps; spectrum composition; Chemical analysis; Chemical products; Data analysis; Data mining; Diffraction; Electrons; Inorganic materials; Self organizing feature maps; Spectroscopy; X-ray scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

Neural Networks Proceedings, 1998. IEEE World Congress on Computational Intelligence. The 1998 IEEE International Joint Conference on

Conference_Location

Anchorage, AK

ISSN

1098-7576

Print_ISBN

0-7803-4859-1

Type

conf

DOI

10.1109/IJCNN.1998.682281

Filename

682281