• DocumentCode
    2210180
  • Title

    Evidence for a Correct SiO2 Voltage Acceleration Model

  • Author

    Miller, W.M. ; Messick, C. ; Smith, N.F. ; Shideler, J.A.

  • Author_Institution
    Sandia National Laboratories
  • fYear
    1993
  • fDate
    24-27 Oct 1993
  • Firstpage
    45
  • Lastpage
    51
  • Keywords
    Acceleration; Capacitors; Electric breakdown; Electronic mail; Extrapolation; Laboratories; Semiconductor device breakdown; Semiconductor device modeling; System testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report, 1993 International
  • Type

    conf

  • DOI
    10.1109/IRWS.1993.666291
  • Filename
    666291
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2210180