DocumentCode :
2211137
Title :
Device Design Issues for Electro-static Discharge Suppression Based on the Monitoring of the Lattice Temperature
Author :
Lim, Gwang-hyeon ; Yoo, Kwang-dong ; Jin, Joo-hyun ; Lim, Sun-kwon ; Choi, Kyu-hyun
Author_Institution :
Samsung Electronics
fYear :
1993
fDate :
24-27 Oct 1993
Firstpage :
79
Lastpage :
89
Keywords :
Biological system modeling; Circuit simulation; Electrostatic discharge; Immune system; Lattices; MOSFETs; Monitoring; Protection; Silicon; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report, 1993 International
Type :
conf
DOI :
10.1109/IRWS.1993.666295
Filename :
666295
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2211137
