Abstract :
Presents the welcome message from the conference proceedings.
Keywords :
Antenna measurements; Area measurement; Electromagnetic compatibility; Microwave antennas; Microwave imaging; Microwave measurements; Technological innovation;
Conference_Titel :
Applications of Electromagnetism and Student Innovation Competition Awards (AEM2C), 2010 International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-6416-6
DOI :
10.1109/AEM2C.2010.5578799
